BS 2634-1-1987 粗糙度比对试样.车、磨、镗、铣、成形和刨削试样规范

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【英文标准名称】:Roughnesscomparisonspecimens.Specificationforturned,ground,bored,milled,shapedandplanedspecimens
【原文标准名称】:粗糙度比对试样.车、磨、镗、铣、成形和刨削试样规范
【标准号】:BS2634-1-1987
【标准状态】:作废
【国别】:英国
【发布日期】:1987-02-27
【实施或试行日期】:1987-02-27
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:比对样品;控制样品;尺寸;精整;磨削;沟;作标记;材料;刨削;生产;粗糙度;粗糙度(表面);彼此间隔的;规范(验收);规范;表面粗糙度测定;表面;公差(测量)
【英文主题词】:Comparisonspecimen;Controlsamples;Dimensions;Finishes;Grinding;Grooves;Marking;Materials;Planing;Production;Roughness;Roughness(surface);Spaced;Specification(approval);Specifications;Surface-roughnessmeasurement;Surfaces;Tolerances(measurement)
【摘要】:Characteristicsofspecimensintendedfortactileandvisualcomparisonwithworkpiecesofsimilarlay,producedbysimilarmachiningmethods.
【中国标准分类号】:J04
【国际标准分类号】:17_040_20
【页数】:8P;A4
【正文语种】:英语


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【英文标准名称】:StandardTestMethodforImpactTestingofMiniaturizedCharpyV-NotchSpecimens
【原文标准名称】:微型夏比V型冲击试样缺口的标准试验方法
【标准号】:ASTME2248-2009
【标准状态】:现行
【国别】:美国
【发布日期】:2009
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:E28.07
【标准类型】:(TestMethod)
【标准水平】:()
【中文主题词】:
【英文主题词】:fractureappearance;impacttest;instrumentedimpacttest;lateralexpansion;miniaturizedCharpytest;notchedspecimens;pendulummachine
【摘要】:TherearecaseswhereitisimpracticalorimpossibletoprepareconventionalCVNspecimens.MCVNspecimensareanalternativeapproachforcharacterizingnotchedspecimenimpactbehavior.TypicalapplicationsincludeMCVNspecimenspreparedfromthebrokenhalvesofpreviouslytestedspecimens,fromthinproductformmaterial,orfrommaterialcutfromin-servicecomponents.ThisstandardestablishestherequirementsforperformingimpacttestsonMCVNspecimensfabricatedfrommetallicmaterials.Minimumrequirementsaregivenformeasurementandrecordingequipmentsuchthatsimilarsensitivityandcomparablemeasurements,ascomparedtoconventionalCVNtests,areachieved.TheusershouldbeawarethatthetransitionregiontemperaturedependencedataobtainedfromMCVNspecimensarenotdirectlycomparabletothoseobtainedfromfull-sizestandardCharpy-Vspecimensandsuitablecorrelationprocedureshavetobeemployedtoobtainductile-to-brittletransitiontemperature(DBTT)dataequivalenttothoseobtainedusingCVNspecimens.Inallinstances,correlationswillhavetobedevelopedtorelateuppershelfenergy(USE)datafromMCVNtesttoCVNcomparableenergylevels.ApplicationofMCVNtestdatatotheevaluationofferriticmaterialbehavioristheresponsibilityoftheuserofthistestmethod.MCVNtestdatashouldnotbeuseddirectlytodeterminethelowestallowableoperatingtemperatureforanin-servicematerial.Thedatamustbeinterpretedwithintheframeworkofafracturemechanicsassessment.WhilethisTestMethodtreatstheuseofaninstrumentedstrikerasanoption,theuseofinstrumentationintheimpacttestisrecommendedandisfullydescribedinTestMethodE2298.Inordertoestablishtheforce-displacementdiagram,itisnecessarytomeasuretheimpactforceasafunctionoftimeduringcontactofthestrikerwiththespecimen.Theareaundertheforce-displacementcurveisameasureofabsorbedenergy.Asanalternative,absorbedenergymaybeevaluateddirectlyfrommachinedialreading.Wheneverpossible,anopticalencodershallbeusedinplaceofthemachinedialbecauseanencoderhasbetterresolutionthanadial.1.1Thistestmethoddescribesnotched-barimpacttestingofmetallicmaterialsusingMiniaturizedCharpyV-Notch(MCVN)specimensandtestapparatus.Itprovides:(a)adescriptionoftheapparatus,(b)requirementsforinspectionandcalibration,(c)safetyprecautions,(d)sampling,(e)dimensionsandpreparationofspecimens,(f)testingprocedures,and(g)precisionandbias.1.2ThisstandardconcernsMiniaturizedCharpyV-Notchspecimens,forwhichalllineardimensions,includinglengthandnotchdepth,arereducedwithrespecttoatypeAstandardimpacttestspecimeninaccordancewithTestMethodsE23.Thesearenotthesameassub-sizespecimens,describedinAnnexA3ofTestMethodsE23,forwhichlength,notchangleandnotchdeptharethesameasforthestandardtypeACharpyspecimen.Seealso1.5below.1.3ComparisonoftheMCVNdatawithconventionalCharpyV-Notch(CVN)dataorapplicationoftheMCVNdata,orboth,totheevaluationofferriticmaterialbehavioristheresponsibilityoftheuserofthistestmethodandisnotexplicitlycoveredbythistestmethod.1.4ThevaluesstatedinSIunitsaretoberegardedasstandard.Nootherunitsofmeasurementareincludedinthisstandard.1.5Thisstandarddoesnotaddresstestingofsub-sizespecimensasdiscussedinTestMethodsE23.Thereadershouldunderstandthedistinctionbetweenminiatureandsubsiz......
【中国标准分类号】:H22
【国际标准分类号】:77_040_10
【页数】:6P.;A4
【正文语种】:英语


【英文标准名称】:StandardTestMethodforMeasuringFlatLengthonWafersofSiliconandOtherElectronicMaterials
【原文标准名称】:硅晶片及其他电子材料的平面长度测量的试验方法
【标准号】:ASTMF671-1999
【标准状态】:作废
【国别】:
【发布日期】:1999
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:F01.06
【标准类型】:(TestMethod)
【标准水平】:()
【中文主题词】:材料;电子工程;长度;垫圈;测量
【英文主题词】:flats;opticalcomparator;orientationflats;semiconductor;silicon
【摘要】:ThisstandardwastransferredtoSEMI(www.semi.org)May20031.1Thistestmethodcoverstechniquesfordeterminationofthelengthoftheflattedportionofawaferperiphery.1.2Thistestmethodisintendedprimarilyforuseonelect
【中国标准分类号】:H80
【国际标准分类号】:29_045
【页数】:4P.;A4
【正文语种】: